Paolo Pedrinazzi,[1] Luca Anzi,[1] Marco Fiocco, [1] Erica Guerriero, [1] Aida Mansouri,[1] Ashkan Behnam,[2] Enrique A. Carrion,[2] Amaia Pesquera,[3] Alba Centeno,[3] Amaia Zurutuza,[3] Eric Pop,[4] Roman Sordan [1] [1] L-NESS, Department of Physics, Politecnico di Milano, Via Anzani 42, 22100 Como, Italy [2] Electrical and Computer Engineering, University of Illinois, Urbana IL 61801, USA [3] Graphenea, Avenida de Tolosa 76, 20018 Donostia/San Sebastián, Spain [4] Electrical Engineering, Stanford University, Stanford, CA 94305, USA ![]() Here we demonstrate graphene/metal contacts with a typical contact resistance of 80 Ωµm at the Dirac point. The contact resistance was determined by transmission line measurements (TLMs) at room temperature. The low contact resistance was obtained by etching holes in CVD-grown graphene before the deposition of contacts. This increases the contact edge with metal contacts deposited on top and therefore the injection of carriers at the graphene edges [1,2]. Pure Au contacts were used without any adhesion layer or thermal treatment. The lowest contact resistance was 72 Ωµm. Such ultra-low contact resistance is comparable to that of InP THz transistors [3] and provides a viable route to high-frequency GFETs. [1] J. T. Smith et al., ACS Nano 7, 3661 (2013). [2] S. Song et al., Appl. Phys. Lett. 104, 183506 (2014) [3] R. Lai et al., Int. El. Devices Meet. pp. 609–611 (2007) ![]() |
Poster abstracts >